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| No. | Article |
|---|---|
| 1 |
Increasing the Value of Atomic-Force Microscopy Process Metrology Using a High-Accuracy Scanner, Tip Characterization, and Morphological Image-Analysis Schneir J, Villarrubia JS, Mcwaid TH, Tsai VW, Dixson R Journal of Vacuum Science & Technology B, 14(2), 1540, 1996 |