검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Characterization of subnanometric layers by grazing incidence X-ray reflectometry Emprin B, Troussel P, Soullie G, Stemmler P, Mercere P, Meltchakov E, Jerome A, Delmotte F Thin Solid Films, 556, 54, 2014 |
| No. | Article |
|---|---|
| 1 |
Characterization of subnanometric layers by grazing incidence X-ray reflectometry Emprin B, Troussel P, Soullie G, Stemmler P, Mercere P, Meltchakov E, Jerome A, Delmotte F Thin Solid Films, 556, 54, 2014 |