1 |
An alternative method for measurement of charge carrier mobility in semiconductors using photocurrent transient response Ahn IH, Kyhm J, Lee J, Cho S, Jo Y, Kim DY, Choi SH, Yang W Current Applied Physics, 19(4), 498, 2019 |
2 |
Temperature fields generated by a circular heat source (CHS) in an infinite isotropic medium: Treatment of contact resistances with application to thin films Emanuel M, Bhouri M, Furlotte J, Groulx D, Maassen J International Journal of Heat and Mass Transfer, 137, 677, 2019 |
3 |
Effects of sample length on the transient measurement results of water vapor diffusion coefficient of porous building materials: A case study of autoclave aerated concrete (AAC) with various porosities Tian SQ, Wang K, Fan LW, Yu ZT, Ge J International Journal of Heat and Mass Transfer, 135, 209, 2019 |
4 |
Experimental investigation of heat transfer in a rotor-stator cavity with cooling air inlet at low radius Luo X, Wang L, Zhao X, Xu G, Wu H International Journal of Heat and Mass Transfer, 76, 65, 2014 |
5 |
A fast and accurate physics-based model for the NOx emissions of Diesel engines Asprion J, Chinellato O, Guzzella L Applied Energy, 103, 221, 2013 |
6 |
Study on thermal and optical properties of high power infrared emitter by utilizing dual interface method Ching CP, Devarajan M International Journal of Heat and Mass Transfer, 58(1-2), 578, 2013 |
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Experimental investigation on the leading edge film cooling of cylindrical and laid-back holes with different hole pitches Liu CL, Zhu HR, Zhang ZW, Xu DC International Journal of Heat and Mass Transfer, 55(23-24), 6832, 2012 |
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Thermal study on high power infrared emitter with different thermal interface materials by utilizing dual interface method Ching CP, Devarajan M Thermochimica Acta, 544, 27, 2012 |
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Thermal characterization of active layer in pentacene-based organic thin-film transistors Jang SH, Shin MW Current Applied Physics, 11(1), S280, 2011 |
10 |
Transient Response of Particle Distribution in a Chamber to Transient Particle Injection Zhang N, Zheng ZQ, Eckels S, Nadella VB, Sun XY Particle & Particle Systems Characterization, 26(4), 199, 2009 |