검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Dependence of the performance and reliability of n-metal-oxide-silicon field effect transistors on interlayer dielectric processing Trabzon L, Awadelkarim OO, Werking J Journal of Vacuum Science & Technology B, 17(5), 2216, 1999 |
| 2 |
Electrical-Stress Simulation of Plasma-Damage to Submicron Metal-Oxide-Silicon Field-Effect Transistors - Comparison Between Direct-Current and Alternating-Current Stresses Trabzon L, Awadelkarim OO Journal of Vacuum Science & Technology A, 15(3), 692, 1997 |