화학공학소재연구정보센터
검색결과 : 3건
No. Article
1 Impact of Ge-Sb-Te compound engineering on the set operation performance in phase-change memories
Boniardi M, Ielmini D, Tortorelli I, Redaelli A, Pirovano A, Allegra M, Magistretti M, Bresolin C, Erbetta D, Modelli A, Varesi E, Pellizzer F, Lacaita AL, Bez R
Solid-State Electronics, 58(1), 11, 2011
2 Resistive switching characteristics of NiO films deposited on top of W or Cu pillar bottom electrodes
Dumas C, Deleruyelle D, Demolliens A, Muller C, Spiga S, Cianci E, Fanciulli M, Tortorelli I, Bez R
Thin Solid Films, 519(11), 3798, 2011
3 Phase-change memory technology with self-aligned mu Trench cell architecture for 90 nm node and beyond
Pirovano A, Pellizzer F, Tortorelli I, Rigano A, Harrigan R, Magistretti M, Petruzza P, Varesi E, Redaelli A, Erbetta D, Marangon T, Bedeschi F, Fackenthal R, Atwood G, Bez R
Solid-State Electronics, 52(9), 1467, 2008