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Analysis of codeposited Gd2O3/SiO2 composite thin films by phase modulated spectroscopic ellipsometric technique (Retraction of Vol 253, Pg 1787, 2006) Sahoo NK, Thakur S, Tokas RB Applied Surface Science, 427, 1280, 2018 |
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Morphological, microstructural and optical properties supremacy of binarycomposite films-A study based on Gd2O3/SiO2 system (Retraction of Vol 253, Pg 3455, 2006) Sahoo NK, Thakur S, Tokas RB Applied Surface Science, 427, 1281, 2018 |
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Study of ZrO2 thin films deposited at glancing angle by radio frequency magnetron sputtering under varying substrate rotation Tokas RB, Jena S, Misal JS, Rao KD, Polaki SR, Pratap C, Udupa DV, Thakur S, Kumar S, Sahoo NK Thin Solid Films, 645, 290, 2018 |
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RETRACTION: Retraction of Fractals and superstructures in gadolinia thin film morphology: Influence of process variables on their characteristic parameters (Retraction of Vol 503, Pg 85, 2006) Sahoo NK, Thakur S, Tokas RB Thin Solid Films, 665, 194, 2018 |
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Relative performances of effective medium formulations in interpreting specific composite thin films optical properties (Retraction of Vol 253, Pg 6787, 2007) Sahoo NK, Thakur S, Tokas RB, Kamble NM Applied Surface Science, 420, 992, 2017 |
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Superior refractive index tailoring properties in composite ZrO2/SiO2 thin film systems achieved through reactive electron beam codeposition process (Retraction of Vol 253, Pg 618, 2006) Sahoo NK, Thakur S, Tokas RB Applied Surface Science, 420, 993, 2017 |
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Omnidirectional photonic band gap in magnetron sputtered TiO2/SiO2 one dimensional photonic crystal Jena S, Tokas RB, Sarkar P, Misal JS, Haque SM, Rao KD, Thakur S, Sahoo NK Thin Solid Films, 599, 138, 2016 |
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Effect of angle of deposition on micro-roughness parameters and optical properties of HfO2 thin films deposited by reactive electron beam evaporation Tokas RB, Jena S, Thakur S, Sahoo NK Thin Solid Films, 609, 42, 2016 |
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Study of hafnium oxide thin films deposited by RF magnetron sputtering under glancing angle deposition at varying target to substrate distance Haque SM, Rao KD, Misal JS, Tokas RB, Shinde DD, Ramana JV, Rai S, Sahoo NK Applied Surface Science, 353, 459, 2015 |
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RF plasma enhanced MOCVD of yttria stabilized zirconia thin films using octanedionate precursors and their characterization Chopade SS, Nayak C, Bhattacharyya D, Jha SN, Tokas RB, Sahoo NK, Deo MN, Biswas A, Rai S, Raman KHT, Rao GM, Kumar N, Patil DS Applied Surface Science, 355, 82, 2015 |