검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
In-line small-spot X-ray fluorescence assessment of electroplating and chemical mechanical polishing de Mussy JPG, Bottiglieri G, Heylen N, Carbonell L, O'Dell J, Agnihotri DK, Tokar A, Mazor I Journal of the Electrochemical Society, 153(9), G851, 2006 |
| 2 |
In-line monitoring of advanced microelectronic processes using combined X-ray techniques Wyon C, Delille D, Gonchond JP, Heider F, Kwakman L, Marthon S, Mazor I, Michallet A, Muyard D, Perino-Gallice L, Royer JC, Tokar A Thin Solid Films, 450(1), 84, 2004 |
| 3 |
Microstructural characterization of gamma-TiAl base alloy by electron probe x-ray microanalysis and electron backscatter diffraction Levin L, Tokar A, Berner A Journal of Materials Science, 35(15), 3923, 2000 |