검색결과 : 10건
No. | Article |
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1 |
Ferroelectric Self-Poling, Switching, and Monoclinic Domain Configuration in BiFeO3 Thin Films Beekman C, Siemons W, Chi M, Balke N, Howe JY, Ward TZ, Maksymovych P, Budai JD, Tischler JZ, Xu R, Liu W, Christen HM Advanced Functional Materials, 26(28), 5166, 2016 |
2 |
Metallization of vanadium dioxide driven by large phonon entropy Budai JD, Hong JW, Manley ME, Specht ED, Li CW, Tischler JZ, Abernathy DL, Said AH, Leu BM, Boatner LA, McQueeney RJ, Delaire O Nature, 515(7528), 535, 2014 |
3 |
New Ternary Europium Aluminate Luminescent Nanoribbons for Advanced Photonics Liu F, Budai JD, Li XF, Tischler JZ, Howe JY, Sun CJ, Meltzer RS, Pan ZW Advanced Functional Materials, 23(16), 1998, 2013 |
4 |
Atomic Layer Engineering of Perovskite Oxides for Chemically Sharp Heterointerfaces Choi WS, Rouleau CM, Seo SSA, Luo ZL, Zhou H, Fister TT, Eastman JA, Fuoss PH, Fong DD, Tischler JZ, Eres G, Chisholm MF, Lee HN Advanced Materials, 24(48), 6423, 2012 |
5 |
Fabrication of nested elliptical KB mirrors using profile coating for synchrotron radiation X-ray focusing Liu CA, Ice GE, Liu W, Assoufid L, Qian J, Shi B, Khachatryan R, Wieczorek M, Zschack P, Tischler JZ Applied Surface Science, 258(6), 2182, 2012 |
6 |
Polychromatic X-ray micro- and nanodiffraction for spatially-resolved structural studies Budai JD, Liu W, Tischler JZ, Pan ZW, Norton DP, Larson BC, Yang W, Ice GE Thin Solid Films, 516(22), 8013, 2008 |
7 |
X-ray microbeam measurements of individual dislocation cell elastic strains in deformed single-crystal copper Levine LE, Larson BC, Yang W, Kassner ME, Tischler JZ, Delos-Reyes MA, Fields RJ, Liu WJ Nature Materials, 5(8), 619, 2006 |
8 |
Three-dimensional micron-resolution X-ray Laue diffraction measurement of thermal grain-evolution in aluminum Budai JD, Yang M, Larson BC, Tischler JZ, Liu W, Weiland H, Ice GE Materials Science Forum, 467-470, 1373, 2004 |
9 |
Profile coatings and their applications Liu C, Conley R, Assoufid L, Macrander AT, Ice GE, Tischler JZ, Zhang K Journal of Vacuum Science & Technology A, 21(4), 1579, 2003 |
10 |
X-ray microdiffraction study of growth modes and crystallographic tilts in oxide films on metal substrates Budai JD, Yang WG, Tamura N, Chung JS, Tischler JZ, Larson BC, Ice GE, Park C, Norton DP Nature Materials, 2(7), 487, 2003 |