검색결과 : 3건
No. | Article |
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1 |
Structural investigation of direct current magnetron sputtered Ti/NiV/Ag layers on n(+)Si substrate Resnik D, Kovac J, Vrtacnik D, Amon S Thin Solid Films, 516(21), 7497, 2008 |
2 |
Influence of reactive ion etching damage on the Schottky barrier height of Ti/p-Si interface Fujimura N, Yamaguchi T, Kato H, Ito T Applied Surface Science, 159, 186, 2000 |
3 |
Investigation of the Titanium Silicide Formation in Plasma Activated Physical Vapor-Deposition Wulff H, Klimke J, Steffen H, Eggs C Thin Solid Films, 261(1-2), 25, 1995 |