검색결과 : 10건
| No. | Article |
|---|---|
| 1 |
Designing of AlxGa1-xAs/CIGS tandem solar cell by analytical model Sharbati S, Gharibshahian I, Orouji AA Solar Energy, 188, 1, 2019 |
| 2 |
Reducing threading dislocation density in GaSb photovoltaic devices on GaAs by using AlSb dislocation filtering layers Mansoori A, Addamane SJ, Renteria EJ, Shima DM, Behzadirad M, Vadiee E, Honsberg C, Balakrishnan G Solar Energy Materials and Solar Cells, 185, 21, 2018 |
| 3 |
Growth of SiC single crystals on patterned seeds by a sublimation method Yang XL, Chen XF, Peng Y, Xu XG, Hu XB Journal of Crystal Growth, 439, 7, 2016 |
| 4 |
Simulation study of GaAsP/Si tandem solar cells Onno A, Harder NP, Oberbeck L, Liu HY Solar Energy Materials and Solar Cells, 145, 206, 2016 |
| 5 |
High resolution synchrotron X-ray studies of phase separation phenomena and the scaling law for the threading dislocation densities reduction in high quality AlGaN heterostructure Lazarev S, Bauer S, Forghani K, Barchuk M, Scholz F, Baumbach T Journal of Crystal Growth, 370, 51, 2013 |
| 6 |
Reverse graded strain relaxed SiGe buffers for CMOS and optoelectronic integration Shah VA, Dobbie A, Myronov M, Leadley DR Thin Solid Films, 520(8), 3227, 2012 |
| 7 |
Fabrication of high quality Ge virtual substrates by selective epitaxial growth in shallow trench isolated Si (001) trenches Wang G, Loo R, Takeuchi S, Souriau L, Lin JC, Moussa A, Bender H, De Jaeger B, Ong P, Lee W, Meuris M, Caymax M, Vandervorst W, Blanpain B, Heyns MM Thin Solid Films, 518(9), 2538, 2010 |
| 8 |
High-resolution X-ray diffraction analysis on HVPE-grown thick GaN layers Liu JQ, Wang JF, Liu YF, Huang K, Hu XJ, Zhang YM, Xu Y, Xu K, Yang H Journal of Crystal Growth, 311(10), 3080, 2009 |
| 9 |
Dislocation analysis in homoepitaxial GaInN/GaN light emitting diode growth Detchprohm T, Xia Y, Xi Y, Zhu M, Zhao W, Li Y, Schubert EF, Liu L, Tsvetkov D, Hanser D, Wetzel C Journal of Crystal Growth, 298, 272, 2007 |
| 10 |
The growth of high-quality SiGe films with an intermediate Si layer Lee SW, Chen PS, Tsai MJ, Chia CT, Liu CW, Chen LJ Thin Solid Films, 447, 302, 2004 |