검색결과 : 15건
No. | Article |
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1 |
Comparative study of laser induced periodic surface structures formed on pulsed laser deposited and magnetron sputtered titanium oxide films Talbi A, Coddet P, Tabbal M, Thomann AL, Millon E, Stolz A, Boulmer-Leborgne C, O'Connor GM, Semmar N Applied Surface Science, 476, 303, 2019 |
2 |
Sputtered Ag thin films with modified morphologies: Influence on wetting property Dutheil P, Thomann AL, Lecas T, Brault P, Vayer M Applied Surface Science, 347, 101, 2015 |
3 |
About the key factors driving the resistivity of AuOx thin films grown by reactive magnetron sputtering Dolique V, Thomann AL, Millon E, Petit A, Brault P Applied Surface Science, 295, 194, 2014 |
4 |
Molecular dynamic simulation of binary ZrxCu100-x metallic glass thin film growth Xie L, Brault P, Thomann AL, Bedra L Applied Surface Science, 274, 164, 2013 |
5 |
AlCoCrCuFeNi high entropy alloy cluster growth and annealing on silicon: A classical molecular dynamics simulation study Xie L, Brault P, Thomann AL, Bauchire JM Applied Surface Science, 285, 810, 2013 |
6 |
Ballistic and molecular dynamics simulations of aluminum deposition in micro-trenches Kokkoris G, Brault P, Thomann AL, Caillard A, Samelor D, Boudouvis AG, Vahlas C Thin Solid Films, 536, 115, 2013 |
7 |
Energy transferred to the substrate surface during reactive magnetron sputtering of aluminum in Ar/O-2 atmosphere Thomann AL, Cormier PA, Dolique V, Semmar N, Dussart R, Lecas T, Courtois B, Brault P Thin Solid Films, 539, 88, 2013 |
8 |
IR emission from the target during plasma magnetron sputter deposition Cormier PA, Thomann AL, Dolique V, Balhamri A, Dussart R, Semmar N, Lecas T, Brault P, Snyders R, Konstantinidis S Thin Solid Films, 545, 44, 2013 |
9 |
Complex structure/composition relationship in thin films of AlCoCrCuFeNi high entropy alloy Dolique V, Thomann AL, Brault P, Tessier Y, Gillon P Materials Chemistry and Physics, 117(1), 142, 2009 |
10 |
Chemical and structural modifications of laser treated iron surfaces: investigation of laser processing parameters Thomann AL, Basillais A, Wegscheider M, Boulmer-Leborgne C, Pereira A, Delaporte P, Sentis M, Sauvage T Applied Surface Science, 230(1-4), 350, 2004 |