검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
X-Ray Double-Crystal and X-Ray Topographic Characterization of Silicon-Carbide Thin-Films on Silicon, Titanium Carbide, 6H-Silicon Carbide, and Aluminum Nitride/Sapphire Substrates Chaudhuri J, Thokala R, Edgar JH, Sywe BS Thin Solid Films, 274(1-2), 23, 1996 |
| 2 |
Calculated Elastic-Constants of Wide-Band Gap Semiconductor Thin-Films with a Hexagonal Crystal-Structure for Stress Problems Thokala R, Chaudhuri J Thin Solid Films, 266(2), 189, 1995 |