| 1 |
Integrated measurement of Ti and TiN thickness and optical constants using reflectance data through a vacuum chamber window
Tabet MF, Kelkar U, McGahan WA
Journal of Vacuum Science & Technology A, 18(4), 1704, 2000 |
| 2 |
Use of artificial neural networks to predict thickness and optical constants of thin films from reflectance data
Tabet MF, McGahan WA
Thin Solid Films, 370(1-2), 122, 2000 |
| 3 |
Thickness and index measurement of transparent thin films using neural network processed reflectance data
Tabet MF, McGahan WA
Journal of Vacuum Science & Technology A, 17(4), 1836, 1999 |
| 4 |
Determining the Optical-Properties of a Mixed-Metal Oxide Film, CO3-X-Ycrxfeyo4, with Spectroscopic Ellipsometry and Atomic-Force Microscopy
Athey PR, Tabet MF, Urban FK
Journal of Vacuum Science & Technology A, 15(3), 998, 1997 |
| 5 |
Deconvolution of Tip Affected Atomic-Force Microscope Images and Comparison to Rutherford Backscattering Spectrometry
Tabet MF, Urban FK
Journal of Vacuum Science & Technology B, 15(4), 800, 1997 |
| 6 |
Optical-Properties of Cobalt Oxide-Films Deposited by Spray-Pyrolysis
Athey PR, Urban FK, Tabet MF, Mcgahan WA
Journal of Vacuum Science & Technology A, 14(3), 685, 1996 |
| 7 |
Comparison of Atomic-Force Microscope and Rutherford Backscattering Spectrometry Data of Nanometer-Size Zinc Islands
Tabet MF, Urban FK
Thin Solid Films, 290-291, 312, 1996 |
| 8 |
Recent Developments in Ionized Cluster Beam Thin-Film Deposition
Cox AJ, Nainaparampil JJ, Tabet MF, Hosseinitehrani A, Urban FK
Thin Solid Films, 270(1-2), 637, 1995 |
| 9 |
Development of Artificial Neural Networks for in-Situ Ellipsometry of Films Growing on Unknown Substrates
Urban FK, Tabet MF
Journal of Vacuum Science & Technology A, 12(4), 1952, 1994 |
| 10 |
Real-Time, in-Situ Ellipsometry Solutions Using Artificial Neural-Network Preprocessing
Urban FK, Tabet MF
Thin Solid Films, 245(1-2), 167, 1994 |
