검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
A model for tunneling current in multi-layer tunnel dielectrics Govoreanu B, Blomme P, Rosmeulen M, Van Houdt J, De Meyer K Solid-State Electronics, 47(6), 1045, 2003 |
| 2 |
Rate-limiting steps during nitrogen incorporation in furnace-grown silicon oxynitrides: effects on wafer-to-wafer uniformity Dang SS, Takoudis CG Thin Solid Films, 366(1-2), 225, 2000 |