검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Systematic analysis of oxide trap distribution of 4H-SiC DMOSFETs using TSCIS and its correlation with BTI and SILC behavior Baek S, Lee J, Park I, Baek RH, Lee JS Solid-State Electronics, 140, 18, 2018 |
| No. | Article |
|---|---|
| 1 |
Systematic analysis of oxide trap distribution of 4H-SiC DMOSFETs using TSCIS and its correlation with BTI and SILC behavior Baek S, Lee J, Park I, Baek RH, Lee JS Solid-State Electronics, 140, 18, 2018 |