검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Influence of Si/SiO2 interface properties on electrical performance and breakdown characteristics of ultrathin stacked oxide/nitride dielectric films Lee YM, Wu YD Applied Surface Science, 254(15), 4591, 2008 |
| No. | Article |
|---|---|
| 1 |
Influence of Si/SiO2 interface properties on electrical performance and breakdown characteristics of ultrathin stacked oxide/nitride dielectric films Lee YM, Wu YD Applied Surface Science, 254(15), 4591, 2008 |