화학공학소재연구정보센터
검색결과 : 2건
No. Article
1 Electron mobility extraction in triangular gate-all-around Si nanowire junctionless nMOSFETs with cross-section down to 5 nm
Najmzadeh M, Berthome M, Sallese JM, Grabinski W, Ionescu AM
Solid-State Electronics, 98, 55, 2014
2 Accumulation-mode gate-all-around si nanowire nMOSFETs with sub-5 nm cross-section and high uniaxial tensile strain
Najmzadeh M, Bouvet D, Grabinski W, Sallese JM, Ionescu AM
Solid-State Electronics, 74, 114, 2012