검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
X-Ray Double-Crystal and X-Ray Topographic Characterization of Silicon-Carbide Thin-Films on Silicon, Titanium Carbide, 6H-Silicon Carbide, and Aluminum Nitride/Sapphire Substrates Chaudhuri J, Thokala R, Edgar JH, Sywe BS Thin Solid Films, 274(1-2), 23, 1996 |
| 2 |
Epitaxial-Growth of SiC on Sapphire Substrates with an AlN Buffer Layer Sywe BS, Yu ZJ, Burckhard S, Edgar JH, Chaudhuri J Journal of the Electrochemical Society, 141(2), 510, 1994 |