화학공학소재연구정보센터
검색결과 : 10건
No. Article
1 Early postnatal maternal separation causes alterations in the expression of beta 3-adrenergic receptor in rat adipose tissue suggesting long-term influence on obesity
Miki T, Liu JQ, Ohta K, Suzuki S, Kusaka T, Warita K, Yokoyama T, Jamal M, Ueki M, Yakura T, Tamai M, Sumitani K, Hosomi N, Takeuchi Y
Biochemical and Biophysical Research Communications, 442(1-2), 68, 2013
2 Influence of Microwave Irradiation on Water-Vapor Desorption from Zeolites
Watanabe F, Sumitani K, Kashiwagi T, Huang HY, Hasatani M, Kobayashi N
KAGAKU KOGAKU RONBUNSHU, 35(5), 431, 2009
3 Surface X-ray scattering of high index plane of platinum containing kink atoms in solid-liquid interface: Pt(310)=3(100)-(110)
Hoshi N, Nakahara A, Nakamura M, Sumitani K, Sakata O
Electrochimica Acta, 53(21), 6070, 2008
4 In situ surface X-ray scattering of stepped surface of platinum: Pt(311)
Nakahara A, Nakamura M, Sumitani K, Sakata O, Hoshi N
Langmuir, 23(22), 10879, 2007
5 Structure of the SiC (0001) 3 X 3 reconstruction studied by surface X-ray diffraction
Voegeli W, Akimoto K, Aoyama T, Sumitani K, Nakatani S, Tajiri H, Takahashi T, Hisada Y, Mukainakano S, Zhang X, Sugiyama H, Kawata H
Applied Surface Science, 252(15), 5259, 2006
6 Study of the surface structure of Si(111)-6 X 1(3 X 1)-Ag using - X-ray crystal truncation rod scattering
Sumitani K, Masuzawa K, Hoshino T, Nakatani S, Takahashi T, Tajiri H, Akimoto K, Sugiyama H, Zhang XW, Kawata H
Applied Surface Science, 252(15), 5288, 2006
7 Crystallization process of high-k gate dielectrics studied by surface X-ray diffraction
Terasawa N, Akimoto K, Mizuno Y, Ichimiya A, Sumitani K, Takahashi T, Zhang XW, Sugiyama H, Kawata H, Nabatame T, Toriumi A
Applied Surface Science, 244(1-4), 16, 2005
8 Structure of the Si(113) surface studied by surface X-ray diffraction
Mizuno Y, Akimoto K, Aoyama T, Suzuki H, Nakahara H, Ichimiya A, Sumitani K, Takahashi T, Zhang XW, Sugiyama H, Kawata H
Applied Surface Science, 237(1-4), 40, 2004
9 Sample holder assembly covering a wide range of temperatures for surface X-ray diffraction
Tajiri H, Sumitani K, Nakatani S, Takahashi T, Akimoto K, Sugiyama H, Zhang X, Kawata H
Applied Surface Science, 237(1-4), 645, 2004
10 Surface Characterization of Sidewall Protection Film on GaAs Steep via Holes Etched by Magnetron Ion Etching
Takano H, Sumitani K, Matsuoka H, Sato K, Ishihara O, Tsubouchi N
Journal of Vacuum Science & Technology B, 14(1), 112, 1996