검색결과 : 4건
| No. | Article |
|---|---|
| 1 |
Position measurement method for alignment in UV imprint using a high index mold and "electronic" moire technique Suehira N, Terasaki A, Okushima S, Seki J, Ono H, Ina H Journal of Vacuum Science & Technology B, 25(3), 853, 2007 |
| 2 |
Observation of Si(100) surface with noncontact atomic force microscope at 5 K Uozumi T, Tomiyoshi Y, Suehira N, Sugawara Y, Morita S Applied Surface Science, 188(3-4), 279, 2002 |
| 3 |
Atom manipulation and image artifact on Si(111)7 x 7 surface using a low temperature noncontact atomic force microscope Sugawara Y, Sano Y, Suehira N, Morita S Applied Surface Science, 188(3-4), 285, 2002 |
| 4 |
Development of low temperature ultrahigh vacuum noncontact atomic force microscope with PZT cantilever Suehira N, Tomiyoshi Y, Sugiyama K, Watanabe S, Fujii T, Sugawara Y, Morita S Applied Surface Science, 157(4), 343, 2000 |