검색결과 : 8건
No. | Article |
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1 |
Low energy electron-excited nanoscale luminescence spectroscopy studies of intrinsic defects in HfO2 and SiO2-HfO2-SiO2-Si stacks Strzhemechny YM, Bataiev M, Tumakha SP, Goss SH, Hinkle CL, Fulton CC, Lucovsky G, Brillson LJ Journal of Vacuum Science & Technology B, 26(1), 232, 2008 |
2 |
Role of defects at nanoscale ZnO and Cu(In,Ga)Se-2 semiconductor interfaces Strzhemechny YM Journal of Vacuum Science & Technology A, 24(4), 1233, 2006 |
3 |
On microscopic compositional and electrostatic properties of grain boundaries in polycrystalline CuIn1-xGaxSe2 Hetzer MJ, Strzhemechny YM, Gao M, Goss S, Contreras MA, Zunger A, Brillson LJ Journal of Vacuum Science & Technology B, 24(4), 1739, 2006 |
4 |
Near-surface defect distributions in Cu(In,Ga)Se-2 Rockett A, Liao D, Heath JT, Cohen JD, Strzhemechny YM, Brillson LJ, Ramanathan K, Shafarman WN Thin Solid Films, 431-432, 301, 2003 |
5 |
Near-surface electronic defects and morphology of CuIn1-xGaxSe2 Strzhemechny YM, Smith PE, Bradley ST, Liao DX, Rockett AA, Ramanathan K, Brillson LJ Journal of Vacuum Science & Technology B, 20(6), 2441, 2002 |
6 |
Surface modification of polyethylene films via bromination: Reactions of brominated polyethylene with aromatic thiolate compounds Chanunpanich N, Ulman A, Malagon A, Strzhemechny YM, Schwarz SA, Janke A, Kratzmueller T, Braun HG Langmuir, 16(7), 3557, 2000 |
7 |
Surface modification of polyethylene through bromination Chanunpanich N, Ulman A, Strzhemechny YM, Schwarz SA, Janke A, Braun HG, Kraztmuller T Langmuir, 15(6), 2089, 1999 |
8 |
Secondary-Ion Mass-Spectrometry Study of Silicon Surface Preparation and the Polystyrene/Silicon Interface Strzhemechny YM, Schwarz SA, Schachter J, Rafailovich MH, Sokolov J Journal of Vacuum Science & Technology A, 15(3), 894, 1997 |