| 1 |
Effects of Manufacturing Processes on Core Losses of Electrical Machines
Sundaria R, Lehikoinen A, Arkkio A, Belahcen A
IEEE Transactions on Energy Conversion, 36(1), 197, 2021 |
| 2 |
Understanding stress effects of wind turbine noise - The integrated approach
Pohl J, Gabriel J, Hubner G
Energy Policy, 112, 119, 2018 |
| 3 |
Theoretical modelling of iron nitriding coupled with a nanocrystallisation treatment. Application to numerical predictions for ferritic stainless steels
Panicaud B, Chemkhi M, Roos A, Retraint D
Applied Surface Science, 258(17), 6611, 2012 |
| 4 |
Acceptance and stress effects of aircraft obstruction markings of wind turbines
Pohl J, Hubner G, Mohs A
Energy Policy, 50, 592, 2012 |
| 5 |
Hydrogen Defect Passivation of Silicon Transistor on Plastic for High Performance Flexible Device Application
Hasan M, Yun SJ, Koo JB, Park SHK, Kim YH, Kang SY, Rho J, Kim JH, Jang H, Ahn JH, Jo MS, Hwang H
Electrochemical and Solid State Letters, 13(3), H80, 2010 |
| 6 |
An experimental study on the criteria for failure of polymer melts in uniaxial extension: The test case of a polyisobutylene melt in different deformation regimes
Barroso VC, Andrade RJ, Maia JM
Journal of Rheology, 54(3), 605, 2010 |
| 7 |
Wormlike micellar solutions: II. Comparison between experimental data and scission model predictions
Pipe CJ, Kim NJ, Vasquez PA, Cook LP, McKinley GH
Journal of Rheology, 54(4), 881, 2010 |
| 8 |
Modeling Diffusion-Induced Stress in Li-Ion Cells with Porous Electrodes
Christensen J
Journal of the Electrochemical Society, 157(3), A366, 2010 |
| 9 |
Effect of source/drain-extension dopant species on device performance of embedded SiGe strained p-metal oxide semiconductor field effect transistors using millisecond annealing
Illgen R, Flachowsky S, Herrmann T, Klix W, Stenzel R, Feudel T, Hontschel J, Horstmann M
Journal of Vacuum Science & Technology B, 28(1), C1I12, 2010 |
| 10 |
Reverse gate bias-induced degradation of AlGaN/GaN high electron mobility transistors
Chang CY, Anderson T, Hite J, Lu L, Lo CF, Chu BH, Cheney DJ, Douglas EA, Gila BP, Ren F, Via GD, Whiting P, Holzworth R, Jones KS, Jang S, Pearton SJ
Journal of Vacuum Science & Technology B, 28(5), 1044, 2010 |
