1 |
Microstructure and mechanical properties of sputter deposited tantalum nitride thin films after high temperature loading Grosser M, Seidel H, Schmid U Thin Solid Films, 629, 69, 2017 |
2 |
Evaluation of residual stress in sputtered tantalum thin-film Al-masha'al A, Bunting A, Cheung R Applied Surface Science, 371, 571, 2016 |
3 |
사출성형 시편 표면의 잔류응력과 케미컬 크랙과의 관계 우정우, 류민영 Polymer(Korea), 39(5), 827, 2015 |
4 |
Experimental and numerical study of residual stress evolution in cold spray coating Ghelichi R, Bagherifard S, MacDonald D, Fernandez-Pariente I, Jodoin B, Guagliano M Applied Surface Science, 288, 26, 2014 |
5 |
Stress evolution of Au/Cu/Au tri-layer systems during annealing Chocyk D, Proszynski A Applied Surface Science, 260, 65, 2012 |
6 |
Magnetic anisotropy control in amorphous FeCoSiB films by stress annealing Peng B, Zhang WL, Xie QY, Zhang WX Thin Solid Films, 520(2), 761, 2011 |
7 |
Laser-ultrasonic characterization of the microstructure of aluminum Moreau A Materials Science Forum, 519-521, 1373, 2006 |
8 |
Evolution of internal stress and microstructure in Ti50CU50 alloy films: influence of substrate temperature and composition Bertel S, Abermann R Thin Solid Films, 473(1), 1, 2005 |
9 |
Inelastic stress relaxation in single crystal SiC substrates Okojie RS Materials Science Forum, 457-460, 375, 2004 |
10 |
Nanoindentation and FEM study of the effect of internal stress on micro/nano mechanical property of thin CNx films Bai MW, Kato K, Umehara N, Miyake Y Thin Solid Films, 377-378, 138, 2000 |