화학공학소재연구정보센터
검색결과 : 10건
No. Article
1 Controlling the structure and ferroic properties of strained epitaxial NiTiO3 thin films on sapphire by post-deposition annealing
Varga T, Droubay TC, Kovarik L, Hu D, Chambers SA
Thin Solid Films, 662, 47, 2018
2 Structure characterization and strain relief analysis in CVD growth of boron phosphide on silicon carbide
Li GL, Abbott JKC, Brasfield JD, Liu PZ, Dale A, Duscher G, Rack PD, Feigerle CS
Applied Surface Science, 327, 7, 2015
3 Residual stress measurement in thin films at sub-micron scale using Focused Ion Beam milling and imaging
Song X, Yeap KB, Zhu J, Belnoue J, Sebastiani M, Bemporad E, Zeng KY, Korsunsky AM
Thin Solid Films, 520(6), 2073, 2012
4 High current density and high PVCR Si/Si1-xGex DQW RTD formed with quadruple-layer buffer
Maekawa H, Sano Y, Ueno C, Suda Y
Journal of Crystal Growth, 301, 1017, 2007
5 Morphology and relaxation in InyGa1-yAs/GaAs multi-layer structures
Gray AL, Stintz A, Malloy KJ, Newell TC, Lester LF
Journal of Crystal Growth, 222(4), 726, 2001
6 Thallium overlayers on Si(111): Structures of a "new" group III element
Vitali L, Leisenberger FP, Ramsey MG, Netzer FP
Journal of Vacuum Science & Technology A, 17(4), 1676, 1999
7 Bi surfactant mediated epitaxy of Ge on Si(111)
Horn-von Hoegen M, Heringdorf FJMZ, Kammler M, Schaeffer C, Reinking D, Hofmann KR
Thin Solid Films, 343-344, 579, 1999
8 Surfactant-grown low-doped germanium layers on silicon with high electron mobilities
Hofmann KR, Reinking D, Kammler M, Horn-von Hoegen M
Thin Solid Films, 321(1-2), 125, 1998
9 Surfactant-mediated epitaxy of Ge on Si: progress in growth and electrical characterization
Kammler M, Reinking D, Hofmann KR, Horn-von Hoegen M
Thin Solid Films, 336(1-2), 29, 1998
10 Surfactant-Mediated Epitaxy of Ge on Si(111) - The Role of Kinetics and Characterization of the Ge Layers
Voigtlander B, Zinner A
Journal of Vacuum Science & Technology A, 12(4), 1932, 1994