검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Analysis of thermal cycle-induced dislocation reduction in HgCdTe/CdTe/Si(211) by scanning transmission electron microscopy Jacobs RN, Benson JD, Stoltz AJ, Almeida LA, Farrell S, Brill G, Salmon M, Newell A Journal of Crystal Growth, 366, 88, 2013 |
| 2 |
Reduction of laser-induced roughness in a-Si : H surfaces for vacuum compatible lithography Jacobs RN, Robinson EW, Stoltz AJ, Dinan JH, Salamanca-Riba L Journal of Vacuum Science & Technology A, 24(4), 1684, 2006 |
| 3 |
Characterization of a-Si : H resists for a vacuum-compatible photolithography process Jacobs RN, Stoltz AJ, Dinan JH, Salamanca-Riba L Journal of Vacuum Science & Technology B, 22(3), 1141, 2004 |