화학공학소재연구정보센터
검색결과 : 3건
No. Article
1 X-ray diffraction analysis of an osmium silicide epilayer grown on Si(100) by molecular beam epitaxy
Amir FZ, Cottier RJ, Golding TD, Donner W, Anibou N, Stokes DW
Journal of Crystal Growth, 294(2), 174, 2006
2 X-ray diffraction analysis of interdiffusion in AlxIn1-xAsySb1-y/GaSb multilayers
Forrest RL, Stokes DW, Li JH, Lukic R, Golding TD
Journal of Vacuum Science & Technology B, 24(3), 1127, 2006
3 Molecular beam epitaxial growth of Fe(Si1-xGex)(2) epilayers
Cottier RJ, Amir FZ, Hossain K, House JB, Gorman BP, Perez JM, Holland OW, Golding TD, Stokes DW
Journal of Vacuum Science & Technology B, 23(3), 1299, 2005