검색결과 : 12건
| No. | Article |
|---|---|
| 1 |
Valuation of energy efficient certificates in buildings Zhang LM, Li Y, Stephenson R, Ashuri B Energy and Buildings, 158, 1226, 2018 |
| 2 |
Small-Scale Mantle Convection Produces Stratigraphic Sequences in Sedimentary Basins Petersen KD, Nielsen SB, Clausen OR, Stephenson R, Gerya T Science, 329(5993), 827, 2010 |
| 3 |
Piezoelectric paint: Ceramic-polymer composites for vibration sensors White JR, De Poumeyrol B, Hale JM, Stephenson R Journal of Materials Science, 39(9), 3105, 2004 |
| 4 |
Effect of exposure of piezoelectric paint to water and salt solution Raptis PN, Stephenson R, Hale JM, White JR Journal of Materials Science, 39(19), 6079, 2004 |
| 5 |
Cation exchange, dehydration, and calcination in clinoptilolite: In situ X-ray diffraction and computer modeling Johnson M, O'Connor D, Barnes P, Catlow CRA, Owens SL, Sankar G, Bell R, Teat SJ, Stephenson R Journal of Physical Chemistry B, 107(4), 942, 2003 |
| 6 |
The Donets Basin (Ukraine/Russia): coalification and thermal history Sachsenhofer RF, Privalov VA, Zhykalyak MV, Bueker C, Panova EA, Rainer T, Shymanovskyy VA, Stephenson R International Journal of Coal Geology, 49(1), 33, 2002 |
| 7 |
Status and review of two-dimensional carrier and dopant profiling using scanning probe microscopy De Wolf P, Stephenson R, Trenkler T, Clarysse T, Hantschel T, Vandevorst W Journal of Vacuum Science & Technology B, 18(1), 361, 2000 |
| 8 |
Nonmonotonic behavior of the scanning capacitance microscope for large dynamic range samples Stephenson R, Verhulst A, De Wolf P, Caymax M, Vandervorst W Journal of Vacuum Science & Technology B, 18(1), 405, 2000 |
| 9 |
Evaluating probes for "electrical" atomic force microscopy Trenkler T, Hantschel T, Stephenson R, De Wolf P, Vandervorst W, Hellemans L, Malave A, Buchel D, Oesterschulze E, Kulisch W, Niedermann P, Sulzbach T, Ohlsson O Journal of Vacuum Science & Technology B, 18(1), 418, 2000 |
| 10 |
Practicalities and limitations of scanning capacitance microscopy for routine integrated circuit characterization Stephenson R, De Wolf P, Trenkler T, Hantschel T, Clarysse T, Jansen P, Vandervorst W Journal of Vacuum Science & Technology B, 18(1), 555, 2000 |