| 1 |
Spectroscopic ellipsometry data inversion using constrained splines and application to characterization of ZnO with various morphologies
Gilliot M, Hadjadj A, Stchakovsky M
Applied Surface Science, 421, 453, 2017 |
| 2 |
Experimental validation of the partial coherence model in spectroscopic ellipsometry and Mueller matrix polarimetry
Miranda-Medina M, Garcia-Caurel E, Peinado A, Stchakovsky M, Hingerl K, Ossikovski R
Applied Surface Science, 421, 656, 2017 |
| 3 |
An original method to determine complex refractive index of liquids by spectroscopic ellipsometry and illustrated applications
Stchakovsky M, Battie Y, Naciri AE
Applied Surface Science, 421, 802, 2017 |
| 4 |
Ellipsometry of Colloidal Solutions: New Experimental Setup and Application to Metallic Colloids
Battie Y, Stchakovsky M, Naciri AE, Akil S, Chaoui N, Broch L
Langmuir, 33(30), 7425, 2017 |
| 5 |
Optical properties of ZnTe and ZnS nanocrystals by critical-points and Tauc-Lorentz models
Naciri AE, Ahmed F, Stchakovsky M
Thin Solid Films, 519(9), 2843, 2011 |
| 6 |
Dielectric functions of PECVD-grown silicon nanoscale inclusions within rapid thermal annealed silicon-rich silicon nitride films
Keita AS, Naciri AE, Delachat F, Carrada M, Ferblantier G, Slaoui A, Stchakovsky M
Thin Solid Films, 519(9), 2870, 2011 |
| 7 |
Polarimetric characterization of optically anisotropic flexible substrates
Stchakovsky M, Caillaud C, Foldyna M, Ossikovski R, Garcia-Caurel E
Thin Solid Films, 516(7), 1414, 2008 |
| 8 |
Optical constants of electroplated Bi2Te3 films by Mueller matrix spectroscopic ellipsometry
Zimmer A, Stchakovsky M, Stein N, Johann L, Eypert C, Boulanger C
Thin Solid Films, 516(10), 2922, 2008 |
| 9 |
Optical characterization of HfO2 by spectroscopic ellipsometry: Dispersion models and direct data inversion
Sancho-Parramon J, Modreanu M, Bosch S, Stchakovsky M
Thin Solid Films, 516(22), 7990, 2008 |
| 10 |
Grafting and polymer formation on silicon from unsaturated grignards: II. Aliphatic precursors
Fellah S, Amiar A, Ozanam F, Chazalviel JN, Vigneron J, Etcheberry A, Stchakovsky M
Journal of Physical Chemistry B, 111(6), 1310, 2007 |
