검색결과 : 4건
| No. | Article |
|---|---|
| 1 |
RTN and BTI in nanoscale MOSFETs: A comprehensive statistical simulation study Amoroso SM, Gerrer L, Markov S, Adamu-Lema F, Asenov A Solid-State Electronics, 84, 120, 2013 |
| 2 |
NEGF simulations of a junctionless Si gate-all-around nanowire transistor with discrete dopants Martinez A, Aldegunde M, Brown AR, Roy S, Asenov A Solid-State Electronics, 71, 101, 2012 |
| 3 |
Assessment of the uncertainty in thermal food processing decisions based on microbial safety objectives Chotyakul N, Velazquez G, Torres JA Journal of Food Engineering, 102(3), 247, 2011 |
| 4 |
Evaluation of statistical variability in 32 and 22 nm technology generation LSTP MOSFETs Cheng B, Roy S, Brown AR, Millar C, Asenov A Solid-State Electronics, 53(7), 767, 2009 |