검색결과 : 2건
No. | Article |
---|---|
1 |
Characterization of sub-100 nm CMOS process using screening experiment technique Srinivasaiah HC, Bhat N Solid-State Electronics, 49(3), 431, 2005 |
2 |
Monte Carlo analysis of the implant dose sensitivity in 0.1 mu m NMOSFET Srinivasaiah HC, Bhat N Solid-State Electronics, 47(8), 1379, 2003 |