| 1 |
High-precision isothermal dilatometry as tool for quantitative analysis of precipitation kinetics: case study of dilute Al alloy
Enzinger R, Hengge E, Sprengel W, Wurschum R
Journal of Materials Science, 54(6), 5083, 2019 |
| 2 |
Kinetics of vacancy annealing upon time-linear heating applied to dilatometry
Enzinger R, Neubauer C, Kotzurek J, Sprengel W, Wurschum R
Journal of Materials Science, 53(4), 2758, 2018 |
| 3 |
Precipitation processes in Al-Mq-Si extending down to initial clustering revealed by the complementary techniques of positron lifetime spectroscopy and dilatometry
Resch L, Klinser G, Hengge E, Enzinger R, Luckabauer M, Sprengel W, Wurschum R
Journal of Materials Science, 53(20), 14657, 2018 |
| 4 |
Dilatometry: a powerful tool for the study of defects in ultrafine-grained metals
Sprengel W, Oberdorfer B, Steyskal EM, Wurschum R
Journal of Materials Science, 47(22), 7921, 2012 |
| 5 |
Defects distribution of Pr2Fe14B hard magnetic magnet from amorphous to nanostructures characterized by positron annihilation spectroscopy
Wu YC, Sprengel W, Reimann K, Reichle KJ, Goll D, Wurschum R, Schaefer HE
Materials Science Forum, 475-479, 2123, 2005 |
| 6 |
Identification of lattice vacancies and structural phase transitions in solids by positron annihilation spectroscopy
Sprengel W, Rempel AA, Baier F, Sato K, Schaefer HE
Materials Science Forum, 445-6, 31, 2004 |
| 7 |
Vacancy studies in silicon-rich intermetallic compounds: MoSi(2)
Sprengel W, Zhang XY, Inui H, Schaefer HE
Materials Science Forum, 445-6, 186, 2004 |
| 8 |
Chemical environment of atomic vacancies in electron irradiated silicon carbide measured by a 2D-Doppler broadening technique
Rempel AA, Blaurock K, Reichle KJ, Sprengel W, Schaefer HE
Materials Science Forum, 389-3, 485, 2002 |
| 9 |
High-accuracy lattice constant measurements of electron-irradiated 6H-SiC single crystals
Seitz C, Rempel AA, Magerl A, Gomm M, Sprengel W, Schaefer HE
Materials Science Forum, 433-4, 289, 2002 |
| 10 |
Identification of vacancies on each sublattice of SiC by coincident Doppler broadening of the positron annihilation photons after electron irradiation
Muller MA, Rempel AA, Reichle K, Sprengel W, Major J, Schaefer HE
Materials Science Forum, 363-3, 70, 2001 |
