| 1 |
Swelling measurement of polymers in high pressure carbon dioxide using a spectroscopic reflectometer
Shinkai T, Ito K, Yokoyama H
Journal of Supercritical Fluids, 95, 553, 2014 |
| 2 |
Assessment of non-uniform thin films using spectroscopic ellipsometry and imaging spectroscopic reflectometry
Necas D, Ohlidal I, Franta D, Cudek V, Ohlidal M, Vodak J, Sladkova L, Zajickova L, Elias M, Vizd'a F
Thin Solid Films, 571, 573, 2014 |
| 3 |
Improved combination of scalar diffraction theory and Rayleigh-Rice theory and its application to spectroscopic ellipsometry of randomly rough surfaces
Ohlidal I, Franta D, Necas D
Thin Solid Films, 571, 695, 2014 |
| 4 |
Optical characterisation of SiOxCyHz thin films non-uniform in thickness using spectroscopic ellipsometry, spectroscopic reflectometry and spectroscopic imaging reflectometry
Ohlidal I, Ohlidal M, Necas D, Franta D, Bursikova V
Thin Solid Films, 519(9), 2874, 2011 |
| 5 |
A convex optimization-based nonlinear filtering algorithm with applications to real-time sensing for patterned wafers
Lee JW, Khargonekar PP
IEEE Transactions on Automatic Control, 48(2), 224, 2003 |
| 6 |
Measurement of refractive index and thickness of fluorinated copolyimide films by spectroscopic reflectometry
Lee MH, Choi BY, Kang Y, Lee C
Molecular Crystals and Liquid Crystals Science and Technology. Section A. Molecular Crystals and Liquid Crystals, 371, 219, 2001 |
