검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Angle resolved XPS for selective characterization of internal and external surface of porous silicon Lion A, Laidani N, Bettotti P, Piotto C, Pepponi G, Barozzi M, Scarpa M Applied Surface Science, 406, 144, 2017 |
| No. | Article |
|---|---|
| 1 |
Angle resolved XPS for selective characterization of internal and external surface of porous silicon Lion A, Laidani N, Bettotti P, Piotto C, Pepponi G, Barozzi M, Scarpa M Applied Surface Science, 406, 144, 2017 |