화학공학소재연구정보센터
검색결과 : 5건
No. Article
1 Real-time, noninvasive monitoring of on energy and ion current at a wafer surface during plasma etching
Sobolewski MA
Journal of Vacuum Science & Technology A, 24(5), 1892, 2006
2 Effect of changing the electrode gap on the spatial and electrical properties Of O-2/CF4 plasmas
Steffens KL, Sobolewski MA
Journal of Vacuum Science & Technology A, 21(1), 241, 2003
3 Planar laser-induced fluorescence of CF2 in O-2/CF4 and O-2/C2F6 chamber-cleaning plasmas: Spatial uniformity and comparison to electrical measurements
Steffens KL, Sobolewski MA
Journal of Vacuum Science & Technology A, 17(2), 517, 1999
4 Electrical control of the spatial uniformity of reactive species in plasmas
Sobolewski MA, Steffens KL
Journal of Vacuum Science & Technology A, 17(6), 3281, 1999
5 Electrical optimization of plasma-enhanced chemical vapor deposition chamber cleaning plasmas
Sobolewski MA, Langan JG, Felker BS
Journal of Vacuum Science & Technology B, 16(1), 173, 1998