화학공학소재연구정보센터
검색결과 : 12건
No. Article
1 Iterative identification of temperature dynamics in single wafer rapid thermal processing
Cho WH, Edgar TF, Lee JT
Korean Journal of Chemical Engineering, 26(2), 307, 2009
2 Effects of water and iso-propyl alcohol relative humidities on single wafer cleaning system performance
Koo J, Kim T, Jung C, Lee J, Kim T
International Journal of Heat and Mass Transfer, 50(21-22), 4275, 2007
3 Mathematical Modeling for Chemical Vapor Deposition in a Single-Wafer Reactor: Application to Low-Pressure Deposition of Tungsten
Park JH
Korean Journal of Chemical Engineering, 19(3), 391, 2002
4 Formation of high conductivity WSix layer and its characterization as a gate electrode
Byun JS, Lee BH, Park JS, Sohn DK, Choi SJ, Kim JJ
Journal of the Electrochemical Society, 145(9), 3228, 1998
5 Numerical approach for modeling and designing silicon epitaxial growth
Habuka H
KAGAKU KOGAKU RONBUNSHU, 24(4), 527, 1998
6 Design and Scale-Up of Chemical-Vapor-Deposition Reactors for Semiconductor Processing
Kleijn CR, Kuijlaars KJ, Vandenakker HE
Chemical Engineering Science, 51(10), 2119, 1996
7 DEPOSITION UNIFORMITIES ON A WAFER AND IN A TRENCH FOR TUNGSTEN SILICIDE LPCVD IN A SINGLE-WAFER REACTOR
Park JH
Korean Journal of Chemical Engineering, 13(2), 105, 1996
8 Modeling and Control of Microelectronics Materials Processing
Badgwell TA, Breedijk T, Bushman SG, Butler SW, Chatterjee S, Edgar TF, Toprac AJ, Trachtenberg I
Computers & Chemical Engineering, 19(1), 1, 1995
9 A Detailed Model for Low-Pressure CVD of Tungsten
Kuijlaars KJ, Kleijn CR, Vandenakker HE
Thin Solid Films, 270(1-2), 456, 1995
10 Effect of Carrier Gases on the Chemical-Vapor-Deposition of Tungsten from Wf6-SiH4
Choi HS, Rhee SW
Journal of the Electrochemical Society, 141(2), 475, 1994