화학공학소재연구정보센터
검색결과 : 15건
No. Article
1 Phase Separation in Fluorite-Related U1-y CeyO2-x: A Re-Examination by X-ray and Neutron Diffraction
Simeone D, Garcia P, Miard A, Baldinozzi G, Porcher F, Berar JF
Inorganic Chemistry, 58(17), 11599, 2019
2 Characterization of Oxygen Defect Clusters in UO2+x Using Neutron Scattering and PDF Analysis
Ma Y, Garcia P, Lechelle J, Miard A, Desgranges L, Baldinozzi G, Simeone D, Fischer HE
Inorganic Chemistry, 57(12), 7064, 2018
3 What Is the Actual Local Crystalline Structure of Uranium Dioxide, UO2? A New Perspective for the Most Used Nuclear Fuel
Desgranges L, Ma Y, Garcia P, Baldinozzi G, Simeone D, Fischer HE
Inorganic Chemistry, 56(1), 321, 2017
4 Investigations of Ar ion irradiation effects on nanocrystalline SiC thin films
Craciun V, Craciun D, Socol G, Behdad S, Boesl B, Himcinschi C, Makino H, Socol M, Simeone D
Applied Surface Science, 374, 339, 2016
5 Structural Changes in the Local Environment of Uranium Atoms in the Three Phases of U4O9
Desgranges L, Baldinozzi G, Simeone D, Fischer HE
Inorganic Chemistry, 55(15), 7485, 2016
6 Ar ions irradiation effects in ZrN thin films grown by pulsed laser deposition
Craciun D, Socol G, Dorcioman G, Simeone D, Gosset D, Behdad S, Boesl B, Craciun V
Applied Surface Science, 336, 129, 2015
7 Influence of sintering methods on microstructure and ionic conductivity of La1.95Sr0.05Zr2O6.975 synthesized by co-precipitation
Huo D, Gosset D, Simeone D, Baldinozzi G, Khodja H, Villeroy B, Surble S
Solid State Ionics, 278, 181, 2015
8 Grazing incidence X-ray diffraction for the study of polycrystalline layers
Simeone D, Baldinozzi G, Gosset D, Le Caer S, Berar JF
Thin Solid Films, 530, 9, 2013
9 Refinement of the alpha-U4O9 Crystalline Structure: New Insight into the U4O9 -> U3O8 Transformation
Desgranges L, Badinozzi G, Simeone D, Fischer HE
Inorganic Chemistry, 50(13), 6146, 2011
10 Pentacene TFTs with parylene passivation layer
Simeone D, Cipolloni S, Mariucci L, Rapisarda M, Minotti A, Pecora A, Cuscuna M, Maiolo L, Fortunato G
Thin Solid Films, 517(23), 6283, 2009