검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Optical characterization of 4H-SiC by variable angle of incidence spectroscopic ellipsometry Lindquist OPA, Arwin H, Forsberg U, Bergman JP, Jarrendahl K Materials Science Forum, 338-3, 575, 2000 |
| No. | Article |
|---|---|
| 1 |
Optical characterization of 4H-SiC by variable angle of incidence spectroscopic ellipsometry Lindquist OPA, Arwin H, Forsberg U, Bergman JP, Jarrendahl K Materials Science Forum, 338-3, 575, 2000 |