화학공학소재연구정보센터
검색결과 : 10건
No. Article
1 Systematic studies of Si and Ge hemispherical concave wafers prepared by plastic deformation
Nakajima K, Fujiwara K, Morishita K
Journal of Crystal Growth, 311(21), 4587, 2009
2 Ga segregation in Czochralski-Si crystal growth with B codoping
Huang XM, Arivanandhan M, Gotoh R, Hoshikawa T, Uda S
Journal of Crystal Growth, 310(14), 3335, 2008
3 Analysis of the reaction at the interface between Si melt and Ba-doped silica glass
Huang X, Hoshikawa T, Uda S
Journal of Crystal Growth, 306(2), 422, 2007
4 In situ observations of crystal growth of spherical Si single crystals
Huang XN, Uda S, Tanabe H, Kitahara N, Arimune H, Hoshikawa K
Journal of Crystal Growth, 307(2), 341, 2007
5 Si multicrystals grown by the Czochralski method with multi-seeds
Hoshikawa T, Taishi T, Huang X, Uda S, Yamatani M, Shirasawa K, Hoshikawa K
Journal of Crystal Growth, 307(2), 466, 2007
6 Segregation of Ga during growth of Si single crystal
Hoshikawa T, Huang X, Uda S, Taishi T
Journal of Crystal Growth, 290(2), 338, 2006
7 Heavily doped silicon crystals: neckless growth and robust wafers
Hoshikawa K, Huang XM, Taishi T
Journal of Crystal Growth, 275(1-2), 276, 2005
8 Reaction at the interface between Si melt and a Ba-doped silica crucible
Huang XM, Koh SJ, Wu KH, Chen MW, Hoshikawa T, Hoshikawa K, Uda S
Journal of Crystal Growth, 277(1-4), 154, 2005
9 FT-IR study of electron- or proton-irradiated Si crystals for solar cells
Nagai N, Ishida H, Hisamatsu T, Aburaya T, Matsuda S
Journal of Crystal Growth, 210(1-3), 74, 2000
10 Dislocation-free B-doped Si crystal growth without Dash necking in Czochralski method: influence of B concentration
Huang XM, Taishi T, Yonenaga I, Hoshikawa K
Journal of Crystal Growth, 213(3-4), 283, 2000