검색결과 : 7건
| No. | Article |
|---|---|
| 1 |
Microscopic Investigation of Degradation Processes in a Polyfluorene Blend by Near-Field Scanning Optical Microscopy Nabha-Barnea S, Maman N, Visoly-Fisher I, Shikler R Macromolecules, 49(17), 6439, 2016 |
| 2 |
New Approach for Analyzing the Vertical Structure of Polymer Thin Films Based on Surface-Enhanced Raman Scattering Linde S, Carella A, Shikler R Macromolecules, 45(3), 1476, 2012 |
| 3 |
Photovoltaic performance and morphology of polyfluorene blends: The influence of phase separation evolution Shikler R, Chiesa M, Friend RH Macromolecules, 39(16), 5393, 2006 |
| 4 |
Assessing the performance of two-dimensional dopant profiling techniques Duhayon N, Eyber P, Fouchier M, Clarysee T, Vandervorst W, Alvarez D, Schoemann S, Ciappa M, Stangoni M, Fichtner W, Formanek P, Kittler M, Raineri V, Giannazzo F, Goghero D, Rosenwaks Y, Shikler R, Saraf S, Sadewasser S, Barreau N, Glatzel T, Verheijen M, Mentink SAM, von Sprekelsen M, Maltezopoulos T, Wiesendanger R, Hellemans L Journal of Vacuum Science & Technology B, 22(1), 385, 2004 |
| 5 |
Resolution of Kelvin probe force microscopy in ultrahigh vacuum: comparison of experiment and simulation Sadewasser S, Glatzel T, Shikler R, Rosenwaks Y, Lux-Steiner MC Applied Surface Science, 210(1-2), 32, 2003 |
| 6 |
Quantitative evaluation of local charge trapping in dielectric stacked gate structures using Kelvin probe force microscopy Lubarsky G, Shikler R, Ashkenasy N, Rosenwaks Y Journal of Vacuum Science & Technology B, 20(5), 1914, 2002 |
| 7 |
Kelvin probe force microscopy using near-field optical tips Shikler R, Rosenwaks Y Applied Surface Science, 157(4), 256, 2000 |