검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Composition depth profile analysis of bulk heterojunction layer by time-of-flight secondary ion mass spectrometry with gradient shaving preparation Yamamoto S, Kitazawa D, Tsukamoto J, Shibamori T, Seki H, Nakagawa Y Thin Solid Films, 518(8), 2115, 2010 |
| 2 |
TOF-SIMS measurement of ultra-thin SiO2 films prepared by the graded-etching method Shibamori T, Muraji Y, Man N, Karen A Applied Surface Science, 203, 449, 2003 |
| 3 |
TOF-SIMS characterization of industrial materials: from silicon wafer to polymer Karen A, Man N, Shibamori T, Takahashi K Applied Surface Science, 203, 541, 2003 |