검색결과 : 2건
No. | Article |
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1 |
Microstructure and strength of AlN-SiC interface studied by synchrotron X-rays Argunova TS, Gutkin MY, Shcherbachev KD, Je JH, Lim JH, Kazarova OP, Mokhov EN Journal of Materials Science, 52(8), 4244, 2017 |
2 |
Near surface layer evolution in Zn+ ions implanted Si upon annealing treatments Saraykin VV, Shcherbachev KD, Petrov DV, Privezentsev VV Applied Surface Science, 267, 97, 2013 |