1 |
Charge collection efficiency of Pt vs. Mg contacts on semi-insulating GaAs Dubecky F, Zatko B, Kolesar V, Kindl D, Hubik P, Gombia E, Dubecky M Applied Surface Science, 467, 1219, 2019 |
2 |
A comparative study of Mg and Pt contacts on semi-insulating GaAs: Electrical and XPS characterization Dubecky F, Kindl D, Hubik P, Micusik M, Dubecky M, Bohacek P, Vanko G, Gombia E, Necas V, Mudron J Applied Surface Science, 395, 131, 2017 |
3 |
Photocurrent spectra of semi-insulating GaAs M-S-M diodes: Role of the contacts Dubecky F, Oswald J, Kindl D, Hubik P, Dubecky M, Gombia E, Sagatova A, Bohacek P, Sekacova M, Necas V Solid-State Electronics, 118, 30, 2016 |
4 |
A new growth method of semi-insulating GaN layer for HEMT structure by eliminating degenerate layer at GaN/sapphire interface Shin IS, Kim D, Lee D, Koh Y, Song KM, Shin CS, Park Y, Yoon E Current Applied Physics, 15, S11, 2015 |
5 |
Backgating effect in III-V MESFET's: A physical model Manifacier JC, Ardebili R Solid-State Electronics, 91, 13, 2014 |
6 |
Contact vs bulk effects in N-semi-insulating-N and P-semi-insulating-P diodes Manifacier JC Solid-State Electronics, 80, 45, 2013 |
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Unexpected current lowering by a low work-function metal contact: Mg/SI-GaAs Dubecky F, Dubecky M, Hubik P, Kindl D, Gombia E, Baldini M, Necas V Solid-State Electronics, 82, 72, 2013 |
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Multiple steady state current-voltage characteristics in drift-diffusion modelisation of N type and semi-insulating GaAs Gunn structures Manifacier JC Solid-State Electronics, 54(12), 1511, 2010 |
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Electron spectroscopies for simultaneous chemical and electrical analysis Opila RL Applied Surface Science, 256(5), 1313, 2009 |
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Nondestructive three-dimensional observation of defects in semi-insulating 6H-SiC single-crystal wafers using a scanning laser microscope (SLM) and infrared light-scattering tomography (IR-LST) Wutimakun P, Buteprongjit C, Morimoto J Journal of Crystal Growth, 311(14), 3781, 2009 |