검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Self-focusing SIMS: A metrology solution to area selective deposition Spampinato V, Armini S, Franquet A, Cunard T, van der Heide P, Vandervorst W Applied Surface Science, 476, 594, 2019 |
| 2 |
Self Focusing SIMS: Probing thin film composition in very confined volumes Franquet A, Douhard B, Melkonyan D, Favia P, Conard T, Vandervorst W Applied Surface Science, 365, 143, 2016 |