검색결과 : 29건
| No. | Article |
|---|---|
| 1 |
Thermal diffusivity of kaolinite-mullite ceramic matrix composite with silicon nitride nanoparticle filler See A, Hassan J, Hashim M, Wahab ZA Thermochimica Acta, 593, 76, 2014 |
| 2 |
Loading Effect of Selective Epitaxial Growth of Silicon Germanium in Submicrometer-Scale Silicon (001) Windows Liu JP, Chew HG, See A, Zhou MS, Hsia LC Electrochemical and Solid State Letters, 12(3), H58, 2009 |
| 3 |
Improved boron activation with reduced preheating temperature during flash annealing of preamorphized silicon Poon CH, See A, Tan YL, Zhou MS, Gui D Journal of the Electrochemical Society, 155(2), H59, 2008 |
| 4 |
Understanding of boron junction stability in preamorphized silicon after optimized flash annealing Yeong SH, Colombeau B, Poon CH, Mok KRC, See A, Benistant F, Tan DXM, Pey KL, Ng CM, Chan L, Srinivasan MP Journal of the Electrochemical Society, 155(7), H508, 2008 |
| 5 |
Effect of germanium preamorphization implant on boron deactivation in silicon following multiple-pulse flash annealing Poon CH, See A, Tan YL, Zhou M, Gui D Electrochemical and Solid State Letters, 10(12), H362, 2007 |
| 6 |
The effect of film thickness on the C40TiSi(2) to C54TiSi2 transition temperature Tan SC, Liu L, Zeng YP, See A, Shen ZX Journal of the Electrochemical Society, 152(10), G754, 2005 |
| 7 |
Mechanism of simultaneous formation of refractory-metal free C40 and C49TiSi(2) induced by Q-switched Nd : Yttrium-aluminum-garnet laser irradiation Tan SC, See A, Yu T, Shen ZX, Lin J Journal of Vacuum Science & Technology B, 23(2), 480, 2005 |
| 8 |
Raman spectroscopic studies of the formation processes of cobalt silicide thin films Liu FM, Ye JH, Ren B, Yang ZL, Liao YY, See A, Chan L, Tian ZQ Thin Solid Films, 471(1-2), 257, 2005 |
| 9 |
Effect of halogen in high-density oxygen plasmas on photoresist trimming Sin CY, Chen BH, Loh WL, Yu J, Yelehanka P, See A, Chan L AIChE Journal, 50(7), 1578, 2004 |
| 10 |
Characterization of HfO2/Si(001) interface with high-resolution Rutherford backscattering spectroscopy Nakajima K, Joumori S, Suzuki M, Kimura K, Osipowicz T, Tok KL, Zheng JZ, See A, Zhang BC Applied Surface Science, 237(1-4), 416, 2004 |