검색결과 : 29건
| No. | Article |
|---|---|
| 1 |
Low-temperature growth of InxGa1-xN films by radio-frequency magnetron sputtering Wang J, Shi XJ, Zhu J Applied Surface Science, 265, 399, 2013 |
| 2 |
Differential ion beam sputtering of segregated phases in aluminum casting alloys Nguyen CL, Wirtz T, Fleming Y, Metson JB Applied Surface Science, 265, 489, 2013 |
| 3 |
펄스 레이저 증착법으로 제작한 Cu2ZnSnS4 박막의 구조 특성 변화에 대한 증착 시간 효과 변미랑, 배종성, 홍태은, 정의덕, 김신호, 김양도 Korean Journal of Materials Research, 23(1), 7, 2013 |
| 4 |
Sputter depth profiling of Mo/B4C/Si and Mo/Si multilayer nanostructures: A round-robin characterization by different techniques Ber B, Babor P, Brunkov PN, Chapon P, Drozdov MN, Duda R, Kazantsev D, Polkovnikov VN, Yunin P, Tolstogouzov A Thin Solid Films, 540, 96, 2013 |
| 5 |
A high brightness source for nano-probe secondary ion mass spectrometry Smith NS, Tesch PP, Martin NP, Kinion DE Applied Surface Science, 255(4), 1606, 2008 |
| 6 |
Vertical phase separation in spin-coated films of a low bandgap polyfluorene/PCBM blend - Effects of specific substrate interaction Bjorstrom CM, Nilsson S, Bernasik A, Budkowski A, Andersson M, Magnusson KO, Moons E Applied Surface Science, 253(8), 3906, 2007 |
| 7 |
Sputter depth profiling by secondary ion mass spectrometry coupled with sample current measurements Bardi U, Chenakin SP, Lavacchi A, Pagura C, Tolstogouzov A Applied Surface Science, 252(20), 7373, 2006 |
| 8 |
Materials and reaction mechanisms at anode/electrolyte interfaces for SOFCs Horita T, Kishimoto H, Yamaji K, Xiong YP, Sakai N, Brito ME, Yokokawa H Solid State Ionics, 177(19-25), 1941, 2006 |
| 9 |
Active parts for CH4 decomposition and electrochemical oxidation at metal/oxide interfaces by isotope labeling-secondary ion mass spectrometry Horita T, Kishimoto H, Yamaji K, Sakai N, Xiong YP, Brito ME, Yokokawa H, Rai M, Amezawa K, Uchimoto Y Solid State Ionics, 177(35-36), 3179, 2006 |
| 10 |
Low energy RBS and SIMS analysis of the SiGe quantum well Krecar D, Rosner M, Draxler M, Bauer P, Hutter H Applied Surface Science, 252(1), 123, 2005 |