| 1 |
Enhancement of the secondary ion emission induced by fast clusters
Ding FR, Shi P, Nie R, Ma HJ
Applied Surface Science, 255(11), 5866, 2009 |
| 2 |
Ionization probability of sputtered particles as a function of their energy - Part II. Positive Si+ ions
Kudriavtsev Y, Gallardo S, Villegas A, Ramirez G, Asomoza R
Applied Surface Science, 254(13), 3801, 2008 |
| 3 |
4d core hole formation in silver and its role in Ag- secondary ion formation/survival
van der Heide PAW
Applied Surface Science, 252(19), 6433, 2006 |
| 4 |
Characterizing SIMS transient effects apparent in matrix secondary ion signals from silicon under 1 keV Cs+ impact
van der Heide PAW
Applied Surface Science, 252(19), 6456, 2006 |
| 5 |
Influence of massive projectile size and energy on secondary ion yields from organic surfaces
Guillermier C, Della Negra S, Rickman RD, Pinnick V, Schweikert EA
Applied Surface Science, 252(19), 6529, 2006 |
| 6 |
Secondary ion emission from phosphatidic acid sandwich films under atomic and molecular primary ion bombardment
Stapel D, Benninghoven A
Applied Surface Science, 183(3-4), 301, 2001 |
| 7 |
Secondary ion emission from polymethacrylate LB-layers under 0.5-11 keV atomic and molecular primary ion bombardment
Stapel D, Thiemann M, Benninghoven A
Applied Surface Science, 158(3-4), 362, 2000 |
| 8 |
Surface-Reactions Driven by Cluster-Impact - Oxidation of Si(111) by (O-2)(N)(+) (N-Similar-to-1600)
Klopcic SA, Jarrold MF
Journal of Chemical Physics, 106(21), 8855, 1997 |
