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| No. | Article |
|---|---|
| 1 |
Nanometer-scale electronic and microstructural properties of grain boundaries in Cu(In,Ga)Se-2 Sadewasser S, Abou-Ras D, Azulay D, Baier R, Balberg I, Cahen D, Cohen S, Gartsman K, Ganesan K, Kavalakkatt J, Li W, Millo O, Rissom T, Rosenwaks Y, Schock HW, Schwarzman A, Unold T Thin Solid Films, 519(21), 7341, 2011 |