검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
High-resolution scanning spreading resistance microscopy of surrounding-gate transistors Alvarez D, Schomann S, Goebel B, Manger D, Schlosser T, Slesazeck S, Hartwich J, Kretz J, Eyben P, Fouchier M, Vandervorst W Journal of Vacuum Science & Technology B, 22(1), 377, 2004 |
| 2 |
Passivation of the Ge/InP(110) interface by As interlayers: Interface reactions and band offsets Preobrajenski AB, Schomann S, Gebhardt RK, Chasse T Journal of Vacuum Science & Technology B, 18(4), 1973, 2000 |
| 3 |
Surfactant and ordering effects of arsenic interlayers at the Pb/InP(110) interface Schomann S, Chasse T Journal of Vacuum Science & Technology A, 16(5), 2990, 1998 |