화학공학소재연구정보센터
검색결과 : 3건
No. Article
1 Physics-based stability analysis of MOS transistors
Ferrara A, Steeneken PG, Boksteen BK, Heringa A, Scholten AJ, Schmitz J, Hueting RJE
Solid-State Electronics, 113, 28, 2015
2 PSP-SOI: An advanced surface potential based compact model of partially depleted SOI MOSFETs for circuit simulations
Wu W, Li X, Gildenblat G, Workman GO, Veeraraghavan S, McAndrew CC, van Langevelde R, Smit GDJ, Scholten AJ, Klaassen DBM, Watts J
Solid-State Electronics, 53(1), 18, 2009
3 Numerical modeling of RF noise in scaled MOS devices
Jungemann C, Neinhus B, Nguyen CD, Scholten AJ, Tiemeijer LF, Meinerzhagen B
Solid-State Electronics, 50(1), 10, 2006