검색결과 : 7건
| No. | Article |
|---|---|
| 1 |
SiGe/Sigeo2 Interface Defects Lebib S, Schoisswohl M, Cantin JL, Vonbardeleben HJ Thin Solid Films, 294(1-2), 242, 1997 |
| 2 |
X-Ray-Diffraction and Electron-Microscopy Investigation of Porous Si1-xGex Buttard D, Schoisswohl M, Cantin JL, Vonbardeleben HJ Thin Solid Films, 297(1-2), 233, 1997 |
| 3 |
Anodic-Oxidation of P-Type and P(+)-Type Porous Silicon - Surface Structural Transformations and Oxide Formation Cantin JL, Schoisswohl M, Grosman A, Lebib S, Ortega C, Vonbardeleben HJ, Vazsonyi E, Jalsovszky G, Erostyak J Thin Solid Films, 276(1-2), 76, 1996 |
| 4 |
Defects and Visible Photoluminescence in Porous Si1-xGex Schoisswohl M, Cantin JL, Chamarro M, Vonbardeleben HJ, Morgenstern T, Bugiel E, Kissinger W, Andreu RC Thin Solid Films, 276(1-2), 92, 1996 |
| 5 |
Observation of (100) Surfaces in P-Type Porous Silicon by Electron-Paramagnetic-Resonance Cantin JL, Schoisswohl M, Vonbardeleben HJ, Zoubir NH, Vergnat M Thin Solid Films, 276(1-2), 241, 1996 |
| 6 |
Analysis of the Surfaces Structure in Porous Si Schoisswohl M, Vonbardeleben HJ, Morazzani V, Grosman A, Ortega C, Frohnhoff S, Berger MG, Munder H Thin Solid Films, 255(1-2), 123, 1995 |
| 7 |
Defects in Luminescent and Nonluminescent Porous Si Schoisswohl M, Vonbardeleben HJ, Bratus V, Munder H Thin Solid Films, 255(1-2), 163, 1995 |